Product

MESOSCOPE designs and fabricates Metallic Nano-scale probe tip. Via Core-technology, Micro-Surface-Treatment process, all products are cleaned and contact resistance could be down to 50ohm.

MSCT-SA025TPL013TC025-CR2

MSCT-SA025TPL013TC025-CR2

CR2 is ideal for failure analysis below 2nm technology process.

Read More
MSCT-SA025TPL013TC025-CR1

MSCT-SA025TPL013TC025-CR1

CR1 is ideal for failure analysis below 1nm technology process.

Read More
MSCT-SA025TPL013TC025-CR5

MSCT-SA025TPL013TC025-CR5

CR5 is ideal for failure analysis 5nm to 10nm technology process.
Standard type has better durability.

Read More
MSCT-SA025TPL013TC025-CR3

MSCT-SA025TPL013TC025-CR3

CR3 is ideal for failure analysis below 3nm technology process.

Read More
MSCT-SA025TPL013TC025-CR14

MSCT-SA025TPL013TC025-CR14

CR14 is ideal for failure analysis 14nm technology process.

Read More
MSCT-SA025TPL013TC025-CR7

MSCT-SA025TPL013TC025-CR7

CR7 is ideal for failure analysis 7nm to 10nm technology process.

Read More
MSCT-SA025TPL013TC025A3-CR250

MSCT-SA025TPL013TC025A3-CR250

Available to be measured below 250nm device

Read More
MSCT-SA025TPL013TC025A3-CR200

MSCT-SA025TPL013TC025A3-CR200

Available to be measured below 200nm device

Read More
MSCT-SA025TPL013TC025A3-CR150

MSCT-SA025TPL013TC025A3-CR150

Available to be measured below 180nm device

Read More
MSCT-SA025TPL013TC025A3-CR100

MSCT-SA025TPL013TC025A3-CR100

Available to be measured below 130nm device

Read More
MSCT-SA025TPL013TC025A2-CR50

MSCT-SA025TPL013TC025A2-CR50

CR50 is ideal for failure analysis 55nm to 90nm technology process.
Standard type has better durability.

Read More
MSCT-SA025TPL013TC025A2-CR250

MSCT-SA025TPL013TC025A2-CR250

Available to be measured below 250nm device

Read More