Product
MSCT-SA025TPL013TC025-CR14
CR7 is ideal for failure analysis 10nm-20nm process.
- Available on FEI, JEOL, Tescan, Zeiss and Kleindiek systems.
- No need Chemical Clean Process.
- SEM inspection before packing.
- Tip's Resistance is under 50ohm.
- MESOSCOPE unique MST(Micro Surface Treatment) process to increase tip uniformity.
- Wire diameter option: 0.1mm, 0.25mm, 0.3mm, 0.5mm and 0.6mm.
- Available to be measured 10nm-20nm process.

| Material | Tungsten | Coating Material | NA |
| Wire Diameter(WD) | 0.25mm | Total Probe Length(TPL) | 12.5mm |
| Tape Cone(TC) | 2.5mm | Tip Body Diameter(TBD) | - |
| Tape Cone Angle Type | - | Curvature Radius(CR) | <14nm |
| Probe Pre-bent | - | Pre-sleeved into Capillary | - |
| Suitable for measuring Process | 10nm-20nm Process | ||
| MSCT | - | SA | 025 | TPL013 | TC025 | - | CR14 |
|---|---|---|---|---|---|---|---|
| (1) | (2) | (3) | (4) | (5) |
- Application: SA series for SEM based electrical nano-probing application.
- Wire diameter (WD): 0.25mm
- Total probe length (TPL): 12.5mm
- Tape Cone length (TC): 2.5mm
- Curvature radius (CR): <14nm
Diameter at position of 50nm below apex is in the range of 45nm to 55nm.