MSCT-SA025TPL013TC025-CR200BT

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CR200 is ideal for failure analysis ≧180nm process.

Available on FEI, JEOL, Tescan, Zeiss and Kleindiek systems.
No need Chemical Clean Process.
SEM inspection before packing.
Tip's Resistance is under 50ohm.
MESOSCOPE unique MST(Micro Surface Treatment) process to increase tip uniformity.
Wire diameter option: 0.1mm, 0.25mm, 0.3mm, 0.5mm and 0.6mm.
Available to be measured ≧180nm process.

Material	Tungsten	Coating Material	NA
Wire Diameter(WD)	0.25mm	Total Probe Length(TPL)	12.5mm
Tape Cone(TC)	2.5mm	Tip Body Diameter(TBD)	-
Tape Cone Angle Type	-	Curvature Radius(CR)	<200nm
Probe Pre-bent	YES	Pre-sleeved into Capillary	YES
Suitable for measuring Process	≧180nm Process

MSCT	-	SA	025	TPL013	TC025	-	CR200	BT
		(1)	(2)	(3)	(4)		(5)	(6)

Application: SA series for SEM based electrical nano-probing application.
Wire diameter (WD): 0.25mm
Total probe length (TPL): 12.5mm
Tape Cone length (TC): 2.5mm
Cone angle type: A2
Available options: A2 and A3
Curvature radius (CR): <200nm
Diameter at position of 200nm below apex is in the range of 300nm to 450nm.
Probe pre-bent and pre-sleeved into capillary type.
Two options of capillary type 13mm and 17mm.
Standard pre-bent angle is 45 degree. Customized Available.

MESOSCOPE is the world leader in Nano-scale metallic probe manufacturer.

2F.-2, No.9, Zhanye 1st Rd., East Dist., Hsinchu City 30078, Taiwan

886-3-6661059

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