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MSCT-SA025TPL013TC025-CR150B

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MSCT-SA025TPL013TC025-CR150B

Available to be measured below 150nm device

  • Available on FEI, Joel, Tescan, Zeiss and Kleindiek systems.
  • No need to proceed Chemical Clean Process.
  • Have SEM inspection before packing.
  • Tip Resistance is under 50ohm.
  • Have MESOSCOPE unique MST(Micro Surface Treatment) process to increase tip uniformity.
  • Wire diameter option: 0.1mm,0.25mm, 0.3mm, 0.5mm and 0.6mm
  • Available to be measured below 150nm device

Material  Tungsten Coating Material NA
Wire Diameter ( WD) 0.25mm Total Probe Length(TPL)  13mm
Tape Cone ( TC) 2.5mm Tip Body Diameter(TBD) -
Tape Cone Angle Type - Curvature Radius(CR) <150nm
Bended Tip Yes Sleeved into Capillary -
Suitable for measuring Process ≤150nm Manufacturing Process
 
 
MSCT - SA 025 TPL013 TC025 - CR150 B
    (1) (2) (3) (4)   (5) (6)
  1. Probe application type: SA is for SEM based electrical nano-probing application.
  2. Probe wire diameter (WD): 0.25mm
  3. Total probe length (TPL): 13mm
  4. Tape Cone length (TC): 2.5mm.
  5. Tip curvature radius (CR): <150nm.
  6. Tip pre-bent service available. Standard pre-bent angle is 30deg

MESOSCOPE is the world leader in Nano-scale metallic probe manufacturer.

2F.-2, No.9, Zhanye 1st Rd., East Dist., Hsinchu City 30078, Taiwan

886-3-6661059

mesoscope@mesoscope.com.tw

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