MSCT-SA025TPL013TC025A2-CR50BT

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CR50 is ideal for failure analysis ≧55nm process.

Available on FEI, JEOL, Tescan, Zeiss and Kleindiek systems.
No need Chemical Clean Process.
SEM inspection before packing.
Tip's Resistance is under 50ohm.
MESOSCOPE unique MST(Micro Surface Treatment) process to increase tip uniformity.
Wire diameter option: 0.1mm, 0.25mm, 0.3mm, 0.5mm and 0.6mm.
Available to be measured ≧55nm process.

Material	Tungsten	Coating Material	NA
Wire Diameter(WD)	0.25mm	Total Probe Length(TPL)	12.5mm
Tape Cone(TC)	2.5mm	Tip Body Diameter(TBD)	-
Tape Cone Angle Type	A2	Curvature Radius(CR)	<50nm
Probe Pre-bent	YES	Pre-sleeved into Capillary	YES
Suitable for measuring Process	≧55nm Process

MSCT	-	SA	025	TPL013	TC025	A2	-	CR50	BT
		(1)	(2)	(3)	(4)	(5)		(6)	(7)

Application: SA series for SEM based electrical nano-probing application.
Wire diameter (WD): 0.25mm
Total probe length (TPL): 12.5mm
Tape Cone length (TC): 2.5mm
Cone angle type: A2
Available options: A2 and A3
Curvature radius (CR): <50nm
Diameter at position of 50nm below apex is in the range of 80nm to 100nm.
Probe pre-bent and pre-sleeved into capillary type.
Two options of capillary type 13mm and 17mm.
Standard pre-bent angle is 45 degree. Customized Available.

MESOSCOPE is the world leader in Nano-scale metallic probe manufacturer.

2F.-2, No.9, Zhanye 1st Rd., East Dist., Hsinchu City 30078, Taiwan

886-3-6661059

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