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MSCT-SA025TPL013TC025A2-CR35

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MSCT-SA025TPL013TC025A2-CR35

CR35 is ideal for failure analysis 20nm-45nm process.

  • Available on FEI, JEOL, Tescan, Zeiss and Kleindiek systems.
  • No need Chemical Clean Process.
  • SEM inspection before packing.
  • Tip's Resistance is under 50ohm.
  • MESOSCOPE unique MST(Micro Surface Treatment) process to increase tip uniformity.
  • Wire diameter option: 0.1mm, 0.25mm, 0.3mm, 0.5mm and 0.6mm.
  • Available to be measured 20nm-45nm process.

Material  Tungsten Coating Material NA
Wire Diameter(WD) 0.25mm Total Probe Length(TPL)  12.5mm
Tape Cone(TC) 2.5mm Tip Body Diameter(TBD) -
Tape Cone Angle Type A2 Curvature Radius(CR) <35nm
Probe Pre-bent - Pre-sleeved into Capillary -
Suitable for measuring Process 20nm-45nm Process

 

 
MSCT - SA 025 TPL013 TC025 A2 - CR35
    (1) (2) (3) (4) (5)   (6)
  1. Application: SA series for SEM based electrical nano-probing application.
  2. Wire diameter (WD): 0.25mm
  3. Total probe length (TPL): 12.5mm
  4. Tape Cone length (TC): 2.5mm
  5. Cone angle type: A2
    Available options: A2 and A3
  6. Curvature radius (CR): <35nm
    Diameter at position of 50nm below apex is in the range of 65nm to 80nm.

MESOSCOPE is the world leader in Nano-scale metallic probe manufacturer.

2F.-2, No.9, Zhanye 1st Rd., East Dist., Hsinchu City 30078, Taiwan

886-3-6661059

mesoscope@mesoscope.com.tw

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