A3CR50

Curvature Radius 50nm probe.
CR50 is ideal model for failure analysis 45nm to 90nm technology.

MSCT-SA025TPL013TC025A3-CR50

MSCT-SA025TPL013TC025A3-CR50

CR50 is ideal for failure analysis 55nm to 90nm technology process.
Standard type has better durability.

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MSCT-SA025TPL013TC025A3-CR50B

MSCT-SA025TPL013TC025A3-CR50B

CR50 is ideal for failure analysis 55nm to 90nm technology process.
Standard type has better durability.

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MSCT-SA025TPL013TC025A3-CR50BT

MSCT-SA025TPL013TC025A3-CR50BT

CR50 is ideal for failure analysis 55nm to 90nm technology process.
Standard type has better durability.

Read More