A2CR35

Curvature Radius 35nm probe.
CR35 is ideal model for failure analysis 20nm to 32nm technology.

MSCT-SA025TPL013TC025A2-CR35

MSCT-SA025TPL013TC025A2-CR35

CR35 is ideal for failure analysis 20nm to 45nm technology process.
Standard type has better durability.

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MSCT-SA025TPL013TC025A2-CR35B

MSCT-SA025TPL013TC025A2-CR35B

CR35 is ideal for failure analysis 20nm to 45nm technology process.
Standard type has better durability.

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MSCT-SA025TPL013TC025A2-CR35BT

MSCT-SA025TPL013TC025A2-CR35BT

CR35 is ideal for failure analysis 20nm to 45nm technology process.
Standard type has better durability.

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