Product

MESOSCOPE designs and fabricates Metallic Nano-scale probe tip. Via Core-technology, Micro-Surface-Treatment process, all products are cleaned and contact resistance could be down to 50ohm.

MSCT-SA025TPL013TC025-UCR5

MSCT-SA025TPL013TC025-UCR5

Ultra CR5 is ideal for failure analysis below 5nm technology process.
Standard type has better durability.

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MSCT-SA025TPL013TC025-UCR5+

MSCT-SA025TPL013TC025-UCR5+

Ultra CR5 plus is ideal for failure analysis below 3nm technology process.
Plus type has sharper cone angle and shrink profile body.

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MSCT-SA025TPL013TC025-CR5

MSCT-SA025TPL013TC025-CR5

CR5 is ideal for failure analysis 5nm to 10nm technology process.
Standard type has better durability.

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MSCT-SA025TPL013TC025-CR5+

MSCT-SA025TPL013TC025-CR5+

CR5 plus is ideal for failure analysis below 5nm technology process.
Plus type has sharper cone angle and shrink profile body.

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MSCT-SA025TPL013TC025-CR20+

MSCT-SA025TPL013TC025-CR20+

CR20 plus is ideal for failure analysis 10nm to 20nm technology process.
Plus type has sharper cone angle and shrink profile body.

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MSCT-SA025TPL013TC025-CR10+

MSCT-SA025TPL013TC025-CR10+

CR10 plus is ideal for failure analysis 7nm to 10nm technology process.
Plus type has sharper cone angle and shrink profile body.

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MSCT-SA025TPL013TC025A3-CR250

MSCT-SA025TPL013TC025A3-CR250

Available to be measured below 250nm device

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MSCT-SA025TPL013TC025A3-CR200

MSCT-SA025TPL013TC025A3-CR200

Available to be measured below 200nm device

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MSCT-SA025TPL013TC025A3-CR150

MSCT-SA025TPL013TC025A3-CR150

Available to be measured below 180nm device

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MSCT-SA025TPL013TC025A3-CR100

MSCT-SA025TPL013TC025A3-CR100

Available to be measured below 130nm device

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MSCT-SA025TPL013TC025A2-CR50

MSCT-SA025TPL013TC025A2-CR50

CR50 is ideal for failure analysis 55nm to 90nm technology process.
Standard type has better durability.

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MSCT-SA025TPL013TC025A2-CR250

MSCT-SA025TPL013TC025A2-CR250

Available to be measured below 250nm device

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